Silicon carbide (SiC) is a wide
bandgap semiconductor that is inherently capable of operation in unforgiving
environments such as high temperatures and radiation. Currently, the control
circuitry for SiC based power devices and sensors are silicon based, limiting
the overall efficiency of the system in such environments. 4H-SiC integrated
circuits, based on different conventional logic technologies, have been
investigated in the past using different device structures, by various research
groups. This paper presents a thorough investigation of conventional bipolar
logic technologies in 4H-SiC simulated across a wide range of temperatures
(300–773 K) and power supply voltages (7–17 V). Unlike previous studies, this
paper evaluates different technologies using the same device structure in the
simulation, to highlight the true merits of each logic technology. The stable
performance of all the studied logic technologies in SiC validates the
potential of 4H-SiC ICs in small scale logic applications.
Source:IOPscience
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